Antares Advanced Test Technologies Overview
- Founded
- 1970
- Status
- Acquired/Merged
- Employees
- 125
- Latest Deal Type
- Buyout/LBO
- Financing Rounds
- 3
- Investments
- 1
Antares Advanced Test Technologies General Information
Description
Provider of semiconductor test integration services. The company offers semiconductor package testing and manufactures probe cards, automatic test equipment (ATE) interface assemblies, and ATE test boards supplying high-performance test sockets and contactors and has designed and produced DUT (Device Under Test) test sockets for the smallest chip-scale packages, with fewer than eight contacts, up to the largest ASICS and microprocessors, with over 3,000 contacts.
Contact Information
Website
www.antarescontech.com
Formerly Known As
Cerprobe Corporation, K & S Interconnect, Kulicke & Soffa Industries (Package Test Business), Antares conTech
Ownership Status
Acquired/Merged
Financing Status
Private Equity-Backed
Primary Industry
Other Commercial Services
Acquirer
Primary Office
- 1499 Southeast Tech Center Place
- Suite 140
- Vancouver, WA 98683
- United States
Antares Advanced Test Technologies Valuation & Funding
| Deal Type | Date | Amount | Valuation/ EBITDA |
Post-Val | Status | Debt |
|---|
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Request a free trialAntares Advanced Test Technologies Patents
Antares Advanced Test Technologies Recent Patent Activity
| Publication ID | Patent Title | Status | First Filing Date | Technology (CPC) | Citations |
|---|---|---|---|---|---|
| US-6002426-A | Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | Expired - Fee Related | 02-Jul-1997 | 000000000 | 00 |
| AU-6977298-A | Probe assembly and method for switchable multi-dut testing of integrated circuitwafers | Abandoned | 17-Apr-1997 | 00000000000 | |
| US-5923178-A | Probe assembly and method for switchable multi-dut testing of integrated circuit wafers | Expired - Lifetime | 17-Apr-1997 | 00000000000 | 00 |
| EP-0975985-A1 | Probe assembly and method for switchable multi-dut testing of integrated circuit wafers | Withdrawn | 17-Apr-1997 | 00000000000 | 0 |
| EP-0975985-A4 | Probe assembly and method for switchable multi-dut testing of integrated circuit wafers | Withdrawn | 17-Apr-1997 | G01R31/2831 | 0 |
Antares Advanced Test Technologies Signals
Growth Rate
0.80%
Weekly
Growth
Growth
Weekly Growth
0.80%, 93rd %ile
-35.5%.
530%
Size Multiple
219x
Median
Size Multiple
219x, 100th %ile
0.00x
0.95x.
413Kx
Key Data Points
Twitter Followers
5.5k
Similarweb Unique Visitors
15.0K
Majestic Referring Domains
314
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Request a free trialAntares Advanced Test Technologies Former Investors
| Investor Name | Investor Type | Holding | Investor Since | Participating Rounds | Contact Info |
|---|
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Request a free trialAntares Advanced Test Technologies Investments (1)
| Company Name | Deal Date | Deal Type | Deal Size | Industry | Lead Partner |
|---|---|---|---|---|---|
| 000 00000000 | 05-Sep-2006 | 0000000000 | Other Commercial Services | 0000 0000 |