Xitronix Overview

  • Founded
  • 2003
  • Status
  • Acquired/​Merged
  • Employees
  • 11
  • Latest Deal Type
  • M&A

Xitronix General Information


Developer of high precision photo-reflectance metrology equipment intended to serve the worldwide semiconductor manufacturing market. The company's equipment provides the unprecedented capability to measure the electrical and material properties of nanoscale semiconductor structures during the manufacturing process, enabling process engineers to avail direct sensitivity to electronic properties and remains ineffective for in-line process control.

Contact Information

Ownership Status
Financing Status
Formerly Accelerator/Incubator backed
Primary Industry
General Purpose Semiconductors
Other Industries
Production (Semiconductors)
Other Commercial Products
Primary Office
  • 3925 West Braker Lane
  • Suite 3.8041
  • Austin, TX 78759
  • United States
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Xitronix Valuation & Funding

Deal Type Date Amount Raised to Date Post-Val Status Stage
5. Merger/Acquisition 01-Jan-2020 00.00 Completed Generating Revenue
4. Angel (individual) 01-Jun-2010 00000 00.00 Completed Generating Revenue
3. Accelerator/Incubator 24-Apr-2009 00.00 Completed Startup
2. Grant 30-Jun-2008 $500K $1.7M Completed Startup
1. Angel (individual) 19-Apr-2007 $1.7M $1.7M Completed Startup
To view Xitronix’s complete valuation and funding history, request access »

Xitronix Comparisons

HQ Location
Total Raised
Post Valuation
Last Financing Details
Developer of high precision photo-reflectance metrology equipment intended to serve the worldwide semiconductor manufact
General Purpose Semiconductors
Austin, TX
11 As of 2015
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Milpitas, CA
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Xitronix Competitors (1)

Company Name Financing Status Location Employees Total Raised Last Financing Date/Type Last Financing Amount
000 Formerly VC-backed Milpitas, CA 00000 000000&0
You’re viewing 1 of 1 competitors. Get the full list »

Xitronix Patents

Xitronix Recent Patent Activity

Publication ID Patent Title Status First Filing Date Technology (CPC) Citations
US-20120327420-A1 Method and apparatus of z-scan photoreflectance characterization Abandoned 13-Feb-2008 000000000
US-8300227-B2 Method and apparatus of z-scan photoreflectance characterization Active 13-Feb-2008 000000000 0
US-20100315646-A1 Method and apparatus of z-scan photoreflectance characterization Granted 13-Feb-2008 000000000 0
JP-5006331-B2 Method for characterization of light reflection of strain and active dopants in semiconductor structures Expired - Fee Related 27-Oct-2005 000000000
US-20070097370-A1 Method of photo-reflectance characterization of strain and active dopant in semiconductor structures Granted 27-Oct-2005 G01N21/00 00
To view Xitronix’s complete patent history, request access »

Xitronix Signals

Growth Rate

0.80% Weekly
Weekly Growth 0.80%, 93rd %ile
-35.5%. 530%

Size Multiple

219x Median
Size Multiple 219x, 100th %ile
0.00x 0.95x. 413Kx

Key Data Points

Twitter Followers


Similarweb Unique Visitors


Majestic Referring Domains


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Xitronix Former Investors (2)

Investor Name Investor Type Holding Investor Since Participating Rounds Contact Info
Austin Technology Incubator Accelerator/Incubator Minority 000 0000 000000 0
Texas Emerging Technology Fund Venture Capital Minority 000 0000 000000 0
To view Xitronix’s complete investors history, request access »