XwinSys Technology Development Overview
- Founded
-
2012
- Status
-
Acquired/Merged
- Latest Deal Type
-
M&A
- Financing Rounds
-
4
XwinSys Technology Development General Information
Description
Manufacturer of inspection systems designed to automated optical 2 dimension and 3 dimension microscopes. The company's inspection systems integrates intellectual property that combines 2D and 3D image processing technology, along with developing surface scanners of wafers and electronic boards used in semiconductors, enabling semiconductor manufacturers to meet the challenges of roadmap requirements for inspection and metrology of 3D structures.
Contact Information
Website
www.xwinsys.com
Ownership Status
Acquired/Merged
Financing Status
Corporate Backed or Acquired
Primary Industry
Electronic Equipment and Instruments
Other Industries
Diagnostic Equipment
Acquirer
Primary Office
- P.O.B. 997
- Migdal Haemek 2310901
- Israel
+972 00-000-0000
XwinSys Technology Development Valuation & Funding
| Deal Type | Date | Amount | Valuation/ EBITDA |
Post-Val | Status | Debt |
|---|
XwinSys Technology Development Comparisons
Description
Primary
Industry
Industry
HQ Location
Employees
Total Raised
Post Valuation
Last Financing Details
Manufacturer of inspection systems designed to automated optical 2 dimension and 3 dimension microscopes. The company's
Electronic Equipment and Instruments
Migdal Haemek, Israel
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Tokyo, Japan
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Wetzlar, Germany
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Add Comparison
XwinSys Technology Development Competitors (2)
| Company Name | Financing Status | Location | Employees | Total Raised | Last Financing Date/Type | Last Financing Amount |
|---|---|---|---|---|---|---|
| Olympus | Corporation | Tokyo, Japan | 00000 | 00000 | 00000000000 | 00000 |
| 00000 000000000000 | Formerly PE-Backed | Wetzlar, Germany | 0000 | 000000&0 |
XwinSys Technology Development Patents
XwinSys Technology Development Recent Patent Activity
| Publication ID | Patent Title | Status | First Filing Date | Technology (CPC) | Citations |
|---|---|---|---|---|---|
| US-10697908-B2 | Metrology inspection apparatus | Active | 01-Jun-2015 | 00000000000 | |
| US-20180128756-A1 | Metrology measuring apparatus | Active | 01-Jun-2015 | 0000000000 | |
| US-10697907-B2 | Metrology measuring apparatus | Active | 01-Jun-2015 | 0000000000 | |
| US-20180128757-A1 | Metrology inspection apparatus | Active | 01-Jun-2015 | 0000000000 | |
| US-9335283-B2 | Method and a system for recognizing voids in a bump | Active | 12-Sep-2011 | G01N23/22 |
XwinSys Technology Development Former Investors
| Investor Name | Investor Type | Holding | Investor Since | Participating Rounds | Contact Info |
|---|